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Yale E. Strausser

Total Book : 2

Characterization in Silicon Processing
Author: Yale E. Strausser
ISBN: 1606501097 / 9781606501092
Year: 2009
Availability: Out of Stock

With a focus on the use of materials characterization techniques for silicon-based semiconductors, this volume in the Materials Characterization series focuses on the process flow of silicon wafer m...

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