Title: Wire Bonding in Microelectronics, 3rd Edition (With CD-Rom) Author: George Harman ISBN: 0071476237 / 9780071476232 Format: Hard Cover Pages: 446 Publisher: McGraw-Hill Year: 2010 Availability: Out of Stock
Description
Contents
The Industry Standard Guide to Wire Bonding--Fully Updated
The definitive resource on the critical process of connecting semiconductors with their packages. Wire Bonding in Microelectronics, Third Edition, has been thoroughly revised to help you meet the challenges of today's small-scale and fine-pitch microelectronics. This authoritative guide covers every aspect of designing, manufacturing, and evaluating wire bonds engineered with cutting-edge techniques. In addition to gaining a full grasp of bonding technology, you'll learn how to create reliable bonds at exceedingly high yields, test wire bonds, solve common bonding problems, implement molecular cleaning methods, and much more.
COVERAGE INCLUDES:
Ultrasonic bonding systems and technologies, including high-frequency systems
Bonding wire metallurgy and characteristics, including copper wire
Wire bond testing
Gold-aluminum intermetallic compounds and other interface reactions
Gold and nickel-based bond pad plating materials and problems
Cleaning to improve bondability and reliability
Mechanical problems in wire bonding
High-yield, fine-pitch, specialized-looping, soft-substrate, and extreme-temperature wire bonds
Copper, low-dielectric-constant (Cu/Lo-k) technology and problems
Wire bonding process modeling and simulation
Introduction to Third Edition
Acknowledgments
Introduction to CD
Chapter 1 : The Technical Introduction to the Third Edition Chapter 2 : Ultrasonic Bonding Systems and Technologies, Including a Description of the Ultrasonic Wire Bonding Mechanism Chapter 3 : Bonding Wire Metallurgy and Characteristics That Can Affect Bonding, Reliability, or Testing Chapter 4 : Wire Bond Testing Chapter 5 : Gold-Aluminum Intermetallic Compounds and Other Metallic Interface Reactions in Wire Bonding Chapter 6 : Introduction to Plating, Section A (Gold) and Section B (Nickel-Based) Bond Pad Technology and Reliability Chapter 7 : Cleaning to Improve Bondability and Reliability Chapter 8 : Mechanical Problems in Wire Bonding Chapter 9 : Advanced and Specialized Wire Bonding Technologies Chapter 10 : An Overview of the Materials and Material Science of Copper, Low-k Devices that Affect Bonding and Packaging Chapter 11 : Wire Bonding Process Modeling and Simulation