Troubleshooting tool for manufacturing processes.
A hands-on, solutions-oriented guide, Process Quality Control, Third Edition, by Ellis R, Ott, Edward G. Schilling, and Dean V. Neubauer, gives you a systematic approach to gathering and analyzing data for troubleshooting manufacturing processes. This classic emphasizes short term and long term variability, particularly with regard to process capability and performance. The third edition gives you many new analytical methods, insights into their application, and case studies. These techniques include tolerance intervals, a test for the comparison of long term and short term variation, simplified attribute sample size determination, and an updated discussion of sampling. You'll also find an expanded discussion of control charts, including trend charts, manual adjustment charts, and short run charts. While the emphasis is on process control, you'll also find significant material on analysis of means.
Case Histories
Preface to the Third Edition
Preface to the Second Edition
Preface to the First Edition
Part 1 : Basics of Interpretation of Data
Chapter 1 : Variables Data : An Introduction
Chapter 2 : Ideas from Time Sequences of Observations
Chapter 3 : Ideas from Outliers—Variables Data
Chapter 4 : Variability—Estimating and Comparing
Chapter 5 : Attributes or Go No-Go Data
Part 2 : Statistical Process Control
Chapter 6 : On Sampling to Provide a Feedback of Information
Chapter 7 : Narrow-Limit Gauging in Process Control
Chapter 8 : On Implementing Statistical Process Control
Part 3 : Troubleshooting and Process Improvement
Chapter 9 : Some Basic Ideas and Methods of Troubleshooting
Chapter 10 : Some Concepts of Statistical Design of Experiments
Chapter 11 : Troubleshooting with Attributes Data
Chapter 12 : Special Strategies in Troubleshooting
Chapter 13 : Comparing Two Process Averages
Chapter 14 : Troubleshooting with Variables Data
Chapter 15 : More Than Two Levels of an Independent Variable
Chapter 16 : What’s on the CD
Chapter 17 : Epilogue
Appendix Tables
Index
