The objective of this book is to better understand why components fail, addressing the needs of engineers who will apply reliability principles in design, manufacture, testing, and field service. It so contributes to new approaches and the development of electronic and telecommunications component reliability. As a reference source, it summarizes the knowledge on failure modes, degradation and mechanisms, including a survey of accelerated testing, achieving better reliability, total quality topics, screening tests and prediction methods. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography round the benefit offered by the book. The technical level suites to senior and graduate students, as well as to experts and managers in industries
Foreword
Acknowledgements
Preface
Chapter 1. : Introduction
Chapter 2. : State of the Art in Reliability
Chapter 3. : Reliability of Passive Electronic Parts
Chapter 4. : Reliability of Diodes
Chapter 5. : Reliability of Silicon Transistors
Chapter 6. : Reliability of Thyristors
Chapter 7. : Reliability of Integrated Circuits
Chapter 8. : Reliability of Hybrids
Chapter 9. : Reliability of Memories
Chapter 10. : Reliability of Optoelectronics
Chapter 11. : Noise and Reliability
Chapter 12. : Plastic Package and Reliability
Chapter 13. : Test and Testability of Logic ICs
Chapter 14. : Failure Analysis
Appendix
General Bibliography
Reliability Glossary
List of Abbreviations
Polyglot Dictionary of Reliability Terms
Index
