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IEC Standards

 Total Items : 8295
 

IEC TS 62607-5-1:2014 :

Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements

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IEC TS 62607-5-3:2020 :

Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

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IEC TS 62607-5-4:2022 :

Nanomanufacturing - Key control characteristics - Part 5-4: Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)

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IEC TS 62607-6-10:2021 :

Nanomanufacturing - Key control characteristics - Part 6-10: Graphene-based material - Sheet resistance: Terahertz time-domain spectroscopy

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IEC TS 62607-6-11:2022 :

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

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IEC TS 62607-6-13:2020 :

Nanomanufacturing - Key control characteristics - Part 6-13: Graphene powder - Oxygen functional group content: Boehm titration method

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IEC TS 62607-6-14:2020 :

Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy

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IEC TS 62607-6-16:2022 :

Nanomanufacturing - Key control characteristics - Part 6-16: Two-dimensional materials - Carrier concentration: Field effect transistor method

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IEC TS 62607-6-18:2022 :

Nanomanufacturing - Key control characteristics - Part 6-18: Graphene-based material - Functional groups: TGA-FTIR

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IEC TS 62607-6-19:2021 :

Nanomanufacturing - Key control characteristics - Part 6-19: Graphene-based material - Elemental composition: CS analyser, ONH analyser

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IEC TS 62607-6-1:2020 :

Nanomanufacturing - Key control characteristics - Part 6-1: Graphene-based material - Volume resistivity: four probe method

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IEC TS 62607-6-20:2022 :

Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based material - Metallic impurity content: Inductively coupled plasma mass spectrometry

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IEC TS 62607-6-21:2022 :

Nanomanufacturing - Key control characteristics - Part 6-21: Graphene-based material - Elemental composition, C/O ratio: X-ray photoelectron spectroscopy

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IEC TS 62607-6-22:2022 :

Nanomanufacturing - Key control characteristics - Part 6-22: Graphene-based material - Ash content: Incineration

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IEC TS 62607-6-3:2020 :

Nanomanufacturing - Key control characteristics - Part 6-3: Graphene-based material - Domain size: substrate oxidation

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IEC TS 62607-6-4:2016 :

Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Surface conductance measurement using resonant cavity

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IEC TS 62607-6-5:2022 :

Nanomanufacturing - Key control characteristics - Part 6-5: Graphene-based materials - Contact and sheet resistance: transmission line measurement

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IEC TS 62607-6-6:2021 :

Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy

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IEC TS 62607-6-9:2022 :

Nanomanufacturing - Key control characteristics - Part 6-9: Graphene-based material - Sheet resistance: Eddy current method

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IEC TS 62607-8-1:2020 :

Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current

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IEC TS 62607-8-2:2021 :

Nanomanufacturing - Key control characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current

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IEC TS 62607-9-1:2021 :

Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy

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IEC TS 62610-1:2009 :

Mechanical structures for electronic equipment - Thermal management for cabinets in accordance wit IEC 60297 and IEC 60917 series - Part 1: Design guide: Interface dimension and provision for thermoelectrical cooling systems (Peltier effect)

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IEC TS 62610-3:2009 :

Mechanical structures for electronic equipment - Thermal management for cabinets in accordance with IEC 60297 and IEC 60917 series - Part 3: Design guide: Evaluation method for thermoelectrical cooling systems (Peltier effect)

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IEC TS 62622:2012 :

Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings

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