Characterization of Organic Thin Films

Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering.

This volume in the Materials Characterization series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such.

Readers will find detailed information on:

• Various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopy
• X-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron Spectroscopy
• Concise Summaries of major characterization technologies for organic thin films, including, Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and Transmission Electron Microscopy (TEM)

Contributors

Part I : Preparation and Materials
Chapter 1 : Langmuir-Blodgett Films
Chapter 2 : Self-Assembled Monolayers

Part II : Analysis of Film and Surface Properties
Chapter 3 : Spectroscopic Ellipsometry
Chapter 4 : Infrared Spectroscopy in the Characterization of Organic Thin Films
Chapter 5 : Raman Spectroscopic Characterization of Organic Thin Films
Chapter 6 : Surface Potential
Chapter 7 : X-Ray Diffraction
Chapter 8 : High Resolution Eels Studies of Organic Thin Films and Surfaces
Chapter 9 : Wetting
Chapter 10 : Secondary Ion Mass Spectrometry as Applied to Thin Organic and Polymeric Films
Chapter 11 : X-Ray Photelectron Spectroscopy of Organic Thin Films
Chapter 12 : Molecular Orientation in Thin Films as Probed by Optical Second Harmonic Generation

Appendix : Technique Summaries
Index