Characterization of Metals and Alloys

A better understanding of the microstructure of metals and alloys has led to great advances in the performance and useful applications of these, the oldest of mankind’s engineered materials. This book in the Materials characterizations series focuses on the particular molecular and atomistic properties of metals insofar as how they affect the different techniques for measuring and analyzing internal structure, surface structure, and chemical/physical properties. It provides a vital connection between commonly used characterization techniques like Scanning Electron Microscopy and how such can be used in the various ways that metals are processed, machined, and used.

• Review of relevant mechanical and chemical properties of metals and how they affect characterization techniques
• Characterization techniques used for melting and casting, machining, and metallic thin films processes
• Concise summaries of major characterization technologies for metals and alloys, including Auger Electron Spectroscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis, Scanning Electron Microscopy, and Transmission Electron Spectroscopy

Preface to the Reissue of the Materials Characterization Series
Preface to Series
Preface to the Reissue of Characterization of Metals and Alloys
Preface
Acronyms Glossary
Contributors

Chapter 1 : Introduction
Chapter 2 : Mechanical Properties and Interfacial Analysis
Chapter 3 : Chemical Properties
Chapter 4 : Surface and thin Film Analysis of Diffusion in Metals
Chapter 5 : Mineral Processing and Metal Reclamation
Chapter 6 : Melting and Casting
Chapter 7 : Machining and Working of Metals
Chapter 8 : Characterization of the Cleaning of Surfaces of Metals and Metal Alloys
Chapter 9 : Coatings and thin Films
Chapter 10 : Failure Analysis

Appendix : Technique Summaries
1 : Auger Electron Spectroscopy (AES)
2 : Cathodoluminescence(CL)
3 : Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS)
4 : Elastic Recoil Spectrometry (ERS)
5 : Electron Energy-Loss Spectroscopy in the Transmission electron Microscope (EELS)
6 : Electron Probe X-Ray Microanalysis (EPMA)
7 : Energy-Dispersive X-Ray Spectroscopy (EDS)
8 : Extended X-Ray Absorption Fine Structure (EXAFS)
9 : Field Ion Microscopy (FIM)
10 : Fourier Transform Infrared Spectroscopy (FTIR)
11 : Glow-Discharge Mass Spectrometry (GDMS)
12 : High-Resolution Electron Energy Loss Spectroscopy (HREELS)
13 : Inductively Coupled Plasma Mass Spectrometry (ICPMS)
14 : Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES)
15 : Ion Scattering Spectroscopy (ISS)
16 : Laser Ionization Mass Spectrometry (LIMS)
17 : Low-Energy Electron Diffraction (LEED)
18 : Low-Energy Electron Microscopy (LEEM)
19 : Magneto-Optic Kerr Effect (MOKE)
20 : Medium-Energy Ion Scattering with Channeling and Blocking (MEIS)
21 : Neutron Activation Analysis (NAA)
22 : Nuclear Reaction Analysis (NRA)
23 : Optical Micro-Reflectometry (OMR) and Differential Reflectometry (DR)
24 : Optical Second Harmonic Generation (SHG)
25 : Particle-Induced X-Ray Emission (PIXE)
26 : Photoacoustic Spectroscopy (PAS)
27 : Photoelectron Emission Microscopy (PEEM)
28 : Photoluminescence (PL)
29 : Reflected Electron Energy-Loss Spectroscopy (REELS)
30 : Reflection High-Energy Electron Diffraction (RHEED)
31 : Rutherford Backscattering Spectrometry (RBS)
32 : Scanning Electron Microscopy (SEM)
33 : Scanning Transmission Electron Microscopy (STEM)
34 : Scanning Tunneling Microscopy and Scanning Force Microscopy (STM and SFM)
35 : Solid State Nuclear Magnetic Resonance (NMR)
36 : Spark Source Mass Spectrometry (SSMS)
37 : Sputtered Neutral Mass Spectrometry (SNMS)
38 : Static Secondary Ion Mass Spectrometry (Static SIMS)
39 : Surface Analysis by Laser Ionization (SALI)
40 : Surface Extended X-Ray Absorption Fine Structure and Near Edge X-Ray Absorption Fine Structure (SEXAFS/NEXAFS)
41 : Temperature Programmed Desorption (TPD)
42 : Total Reflection X-Ray Fluorescence Analysis (TXRF)
43 : Transmission Electron Microscopy (TEM)
44 : Ultraviolet Photoelectron Spectroscopy (UPS)
45 : Variable-Angle Spectroscopic Ellipsometry (VASE)
46 : X-Ray Diffraction (XRD)
47 : X-Ray Fluorescence (XRF)
48 : X-Ray Photoelectron and Auger Electron Diffraction (XPD and AED)
49 : X-Ray Photoelectron Spectroscopy (XPS)

Index