Characterization of Catalytic Materials

Catalytic materials are essential to nearly every commercial and industrial chemical process in order to make reaction times faster and more efficient. Understanding the microstructure of such materials is essential to designing improved catalytic properties.

This volume in the materials characterization series reviews the more common types of characterization methods used for understanding surface and structural properties of most types of commercially used catalytic materials.

• Covers both bulk metals and alloys as well as supported metals metal oxides and metal sulfides
• Characterization techniques for zeolites and molecular sieves as well as alumina pillared clays
• Concise summaries of major characterization technologies for catalytic materials, including Auger Electron Spectroscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis, Scanning Electron Microscopy, and Transmission Electron Spectroscopy

Preface to the Reissue of the Materials Characterization Series
Preface to Series
Preface to the Reissue of Characterization of Catalytic Materials
Preface
Contributors

Chapter 1 : Bulk Metals and Alloys
Chapter 2 : Supported Metals
Chapter 3 : Bulk Metal Oxides
Chapter 4 : Supported Metal Oxides
Chapter 5 : Bulk Metal Sulfides
Chapter 6 : Supported Metal Sulfides
Chapter 7 : Zeolites and Molecular Sieves
Chapter 8 : Alumina Pillared Clays: Methods of Preparation and Characterization

Appendixes Techniques Summaries
1 : Auger Electron Spectroscopy (AES)
2 : Dynamic Secondary Ion Mass Spectrometry (D-SIMS)
3 : Electron Energy-Loss Spectroscopy in the Transmission Electron Microscope (EELS)
4 : Electron Paramagnetic Resonance/Electron Spin Resonance
5 : Electron Probe X-Ray Microanalysis (EPMA)
6 : Energy-Dispersive X-Ray Spectroscopy (EDS)
7 : Extended X-Ray Absorption Fine Structure (EXAFS)
8 : Fourier Transform Infrared Spectroscopy (FTIR)
9 : High-Resolution Electron Energy Loss Spectroscopy (HREELS)
10 : Inductively Coupled Plasma Mass Spectrometry (ICPMS)
11 : Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES)
12 : Ion Scattering Spectroscopy (ISS)
13 : Low-Energy Electron Diffraction (LEED)
14 : Mossbauer Spectroscopy
15 : Neutron Activation Analysis (NAA)
16 : Neutron Diffraction
17 : Physical and Chemical Adsorption for the Measurement of Solid State Areas
18 : Raman Spectroscopy
19 : Scanning Electron Microscopy (SEM)
20 : Scanning Transmission Electron Microscopy (STEM)
21 : Scanning Tunneling Microscopy and Scanning Force Microscopy (STM and SFM)
22 : Solid State Nuclear Magnetic Resonance (NMR)
23 : Static Secondary Ion Mass Spectrometry (Static SIMS)
24 : Temperature Programmed Techniques
25 : Transmission Electron Microscopy (TEM)
26 : Ultraviolet Photoelectron Spectroscopy (UPS)
27 : X-Ray Diffraction (XRD)
28 : X-Ray Fluorescence (XRF)
29 : X-Ray Photoelectron and Auger Electron Diffraction (XPD and AED)
30 : X-Ray Photoelectron Spectroscopy (XPS)

Index