Welcome Guest
  |   0 items in your shopping cart
 

BROWSE BY STANDARDS

BROWSE BY CATEGORY

***
 
 
Join our mailing list to recieve newsletters
 

Accelerated Testing : A Practitioner's Guide to Accelerated and Reliability Testing, 2nd Edition

Send to friend
 
Title: Accelerated Testing : A Practitioner's Guide to Accelerated and Reliability Testing, 2nd Edition
Author: Bryan L Dodson, Harry L. Schwab
ISBN: 1468603507 / 9781468603507
Format: Soft Cover
Pages: 250
Publisher: SAE
Year: 2006
Availability: 45-60 days
     
 
  • Description
  • Contents

The application of accelerated testing theory is a difficult proposition, yet one that can result in considerable time and cost savings, as well as increasing a product's useful life. In Accelerated Testing: A Practitioner's Guide to Accelerated and Reliability Testing, readers are exposed to the latest, most practical knowledge available in this dynamic and important discipline. Authors Bryan Dodson and Harry Schwab draw on their considerable experience in the field to present comprehensive, insightful views in this book.

Development and quality assurance tests are defined in detail and are presented from a practical viewpoint. Included are testing fundamentals, plans and models, and equipment and methods most commonly used in accelerated testing. Individuals seeking to evaluate and improve the design lives of components and systems will find this book a valuable reference, with special attention being paid to testing in the mobility industries.

Preface
Acknowledgments

Chapter 1 : Introduction
Chapter 2 : Probability Fundamentals
Chapter 3 : Distributions
Chapter 4 : Parameter Estimation
Chapter 5 : Accelerated Test Plans
Chapter 6 : Accelerated Testing Models
Chapter 7 : Environmental Stress Screening
Chapter 8 : Test Equipment Methods and Applications

Appendix A : Statistical Tables
Appendix B : Government Documents
Appendix C : Glossary
Appendix D : List of Acronyms
Bibliography
About the Authors
Index

 
 
 
About Us | Contact us
loading...
This page was created in 0.22899103164673 seconds