ASM Handbook Volume 10 : Materials Characterization.

The 2019 edition of ASM Handbook, Volume 10: Materials Characterization provides detailed technical information that will enable readers to select and use analytical techniques that are appropriate for their problem. Each article describing a characterization technique begins with an overview of the method in simplified terms and lists common applications as well as limitations. Sample size, form, and special preparation requirements are listed upfront to help readers quickly decide if the techniques are appropriate to solve their problem. Tables and charts listing the most common characterization methods for different classes of materials are included in the beginning of the handbook. The tables give information on whether the technique is suitable for elemental analysis, qualitative analysis, surface analysis, or alloy verification. The articles also describe material characterization in general terms according to material type and serve as a jumping off point to the more specific technique articles.

Foreword
Preface
List of Contributors
Policy on Units of Measure

Part I : Introduction to Materials Analysis Methods
Chapter 1 : Introduction to Material Analysis and Characterization
Chapter 2 : Characterization of Metals and Alloys
Chapter 3 : Semiconductor Characterization
Chapter 4 : Characterization of Glasses and Ceramics
Chapter 5 : Introduction to Characterization of Organic Solids and Organic Liquids
Chapter 6 : Introduction to Characterization of Powders

Part II : Spectroscopy
Chapter 7 : Optical Emission Spectroscopy
Chapter 8 : Atomic Absorption Spectroscopy
Chapter 9 : Inductively Coupled Plasma Optical Emission Spectroscopy
Chapter 10 : Infrared Spectroscopy
Chapter 11 : Raman Spectroscopy
Chapter 12 : Magnetic Resonance Spectroscopy

Part III : Mass and Ion Spectrometry
Chapter 13 : Solid Analysis by Mass Spectrometry
Chapter 14 : Gas Analysis by Mass Spectrometry
Chapter 15 : Glow Discharge Mass Spectrometry
Chapter 16 : Inductively Coupled Plasma Mass Spectrometry
Chapter 17 : Rutherford Backscattering Spectrometry
Chapter 18 : Low-Energy Ion-Scattering Spectroscopy

Part IV : Chemical Analysis and Separation Techniques
Chapter 19 : Calibration and Experimental Uncertainty
Chapter 20 : Chemical Spot Tests; Presumptive Tests
Chapter 21 : Classical Wet Analytical Chemistry
Chapter 22 : Gas Chromatography
Chapter 23 : Gas Chromatography Mass Spectrometry (GC-MS)
Chapter 24 : Liquid Chromatography
Chapter 25 : Ion Chromatography
Chapter 26 : Electrochemical Methods
Chapter 27 : Neutron Activation Analysis

Part V : Thermal Analysis
Chapter 28 : Differential Scanning Calorimetry
Chapter 29 : Thermogravimetric Analysis
Chapter 30 : Dynamic Mechanical Analysis
Chapter 31 : Thermomechanical Analysis

Part VI : X-Ray Analysis
Chapter 32 : X-Ray Spectroscopy
Chapter 33 : Extended X-Ray Absorption Fine Structure
Chapter 34 : Particle Induced X-Ray Emission
Chapter 35 : Mossbauer Spectroscopy

Part VII : X-Ray and Neutron Diffraction
Chapter 36 : Introduction to Diffraction Methods
Chapter 37 : X-Ray Powder Diffraction
Chapter 38 : Single-Crystal X-Ray Diffraction
Chapter 39 : Micro X-Ray Diffraction
Chapter 40 : X-Ray Diffraction Residual Stress Techniques
Chapter 41 : X-Ray Topography
Chapter 42 : Synchrotron X-Ray Diffraction Applications
Chapter 43 : Neutron Diffraction

Part VIII : Light Optical Metallography
Chapter 44 : Light Optical Metallography
Chapter 45 : Quantitative Metallography

Part IX : Microscopy and Microanalysis
Chapter 46 : Scanning Electron Microscopy
Chapter 47 : Crystallographic Analysis by Electron Backscatter Diffraction in the Scanning Electron Microscope
Chapter 48 : Transmission Electron Microscopy
Chapter 49 : Electron Probe X-ray Microanalysis
Chapter 50 : Focused Ion Beam Instruments

Part X : Surface Analysis
Chapter 51 : Introduction to Surface Analysis
Chapter 52 : Auger Electron Spectroscopy
Chapter 53 : Low Energy Electron Diffraction
Chapter 54 : Introduction to Scanning Probe Microscopy
Chapter 55 : Atomic Force Microscopy
Chapter 56 : Secondary Ion Mass Spectroscopy
Chapter 57 : X-Ray Photoelectron Spectroscopy
Chapter 58 : Thermal Desorption Spectroscopy

Part XI : Reference Information
Glossary of Terms
Index